Filmetrics features a complete line of affordable UV to NIR spectrometer systems for measuring thin film thickness from 1nm t ... o 13mm, optical constants, and deposition rates of thin films. For applications requiring measurement of sub-nanometer surface roughness and/or precision step heights, Filmetrics offers the Profilm3D – an easy-to-use, full-featured profilometer at a fraction of the cost of competitive systems. read more
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